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cleaning critical surfaces
HT1501FCW PolyCHECK Swab HT5291K PolyCHECK Wiper
HT1501FCW - PolyCHECK™ Swab HT5291K - PolyCHECK™ Wiper

PolyCHECK®
Wipers & Swabs



Description

PolyCHECK® Wipers and Swabs are designed to allow engineers and technicians to validate the cleanliness of critical surfaces. PolyCHECK® Wipers are fabricated from a black fabric in order to enable the identification of white or opaque colored particles. PolyCHECK® Swabs employ a white fabric on one side and a black fabric on the other side in order to give clean room professionals a unique particle detection tool. Ideal when used in conjunction with SEM Analysis.

Advantages
Foamtec Eliminates the need to contact SEM stubs and tape to critical chamber surfaces.
Foamtec Allows for faster analysis of particle sources during tool excursion events.
Foamtec Perfect for defect analysis involving SEM stubs.

Applications
Foamtec Ideal for Go/No Go validation checks in vacuum maintenance procedures.
Foamtec Excellent general purpose cleanroom wiper for Semiconductor, Medical Device, FPD and Hard Disk Drive manufacturers.
Foamtec PolyCHECK® Swabs enable frequent inspections to monitor for particles that may back scatter into process chambers.

Part Numbers
Part No. Description Size Case Qty.
HT5291K-5 PolyCHECK® Wiper 9" x 9" 5/Bag, 200 Bags/Cs
HT5291K PolyCHECK® Wiper 9" x 9" 50/Bag, 24 Bags/Cs
HT1501FCW-5 PolyCHECK® Swab 6" Flexible Paddle Tip 5/Bag, 100 Bags/Cs
HT1501FZW-5 PolyCHECK® Swab 6" Paddle Tip 5/Bag, 100 Bags/Cs
HT1585FZW-5 PolyCHECK® Swab 5" Square Tip 5/Bag, 100 Bags/Cs



Cleanliness Specifications
Wiper
Swab
Particle Generation via LPC
>.5 micron
>.5 micron
>.3 micron particles/m2
1500 particles/cm2
<700 particles/tip
Ion Count of Extractables
PPM
Micrograms/Tip
Sulfate
<.05
<.8
Chloride
<.05
<.9
Fluoride
<.02
<.02
Non-Volatile Residue (g/m2)
DI Water
<.5
<.3
IPA
<1.5mg/g
<1
Silicon/Amide Free
Pass


Absorptive Capacity Specifications
Basis Weight (g/m2)
120
Absorbency (ml/m2)
190
Absorptive Rate (ml/g)
3.2
cleaning critical surfaces