The PolyCHECK® Wiper is constructed of black fabric for inspection and verification protocols.
• Eliminates the need to contact SEM stubs and tape to critical chamber surfaces.
• Allows for faster analysis of particle sources during tool excursion events.
• Perfect for defect analysis involving SEM stubs.
• Ideal for Go/No Go validation checks in vacuum maintainence procedures.
• Excellent general purpose cleanroom wiper for Semiconductor, Medical Device, FPD and Hard Disk Drive manufacturers.