The PolyCHECK® FM service enables contamination control engineers and quality managers to identify specific processes and material sources of foreign particle contamination.
Pharmaceutical, medical device, semiconductor and other microelectronics manufacturing facilities devote significant engineering and financial resources trying to solve vexing particle contamination problems. Because specific sources of particle contamination are almost never definitively identified, root-cause corrective actions to prevent yield hits, device rejects, bioburden excursions, tool escalations and CAPAs cannot be implemented.
The PolyCHECK® FM service has been successful in the following situations:
Unlike traditional analytical techniques which fall short of providing a definitive source of the particle contamination, the PolyCHECK® system is production-proven at matching the contamination found on the product to specific processes and material sources.
If your facility has been unable despite spending huge resources to identify sources of foreign material contamination, the PolyCHECK® FM Process can assist you.
Our team of expert technicians will collect samples from problem surfaces, work equipment, consumables and send them to our analytical lab.
Our State-of-the-Art Analytical Lab will perform SEM/EDX & FTIR analysis.
Once the sample analysis has been completed, our team will schedule a meeting to go over a detailed report.
• Our PolyCHECK® Wipes and Swabs are able to collect samples from large and small surfaces very quickly compared to SEM Stubs.
• Our process does not require the facility or workstations to shutdown.
• We not only provide a detailed contamination analysis, we help provide a solution for FM removal.
Schedule an appointment with our expert technicians.Request Service