PolyCHECK® Swabs are designed to allow engineers and technicians to validate the cleanliness of critical surfaces. PolyCHECK® Swabs employ a white fabric on one side and a black fabric on the other side in order to give clean room professionals a unique particle detection tool. Ideal when used in conjunction with SEM Analysis.
• Eliminates the need to contact SEM stubs and tape to critical chamber surfaces.
• Allows for faster analysis of particle sources during tool excursion events.
• Perfect for defect analysis involving SEM stubs.
• Ideal for Go/No Go validation checks in vacuum maintainence procedures.
• Excellent general purpose cleanroom wiper for Semiconductor, Medical Device, FPD and Hard Disk Drive manufacturers.
• PolyCHECK® Swabs enable frequent inspections to monitor for particles that may back scatter into process chambers.